题名

Bayesian Approach for Optimum Step-Stress Accelerated Life Testing

DOI

10.29973/JCSA.200707.0001

作者

Lii-Yuh Leu；Kuan-Fu Shen

关键词

bayesian ； step-stress ； mixture prior distribution ； type Ⅰ censored ； type Ⅱ censored ； asymptotic variance

期刊名称

中國統計學報

卷期/出版年月

45卷3期（2007 / 07 / 01）

页次

221 - 235

内容语文

英文
英文摘要

This paper presents optimum plans for simple step-stress tests from a Bayes viewpoint. We obtain the optimum test plans to minimize the asymptotic variance of the maximum likelihood estimator of the mean life at a design (use) stress. The emphasis of this paper is to establishment of new areas of application to step-stress accelerated life testing (ALT) and an improvement of existing procedures and theories. Examples for Type Ⅰ and Type Ⅱ censored cases are illustrated. The numerical results indicate that under the same conditions, the proposed Bayesian approach is superior to that of Bai (1989) in the sense that the asymptotic variance is smaller.
主题分类 基礎與應用科學 > 統計
参考文献
  1. Atwood, C. L.,Youngblood R. W.(2005).Mixture prior for Bayesian performance monitoring 2: variable-constituent model.Reliab. Eng. System Saf.,89,164-176.
  2. Bai, D. S.,Kim, M. S.,Lee, S. H.(1989).Optimum simple step-stress accelerated life tests with censoring.IEEE Trans. Reliability,38,528-532.
  3. Basu, S.,Rama, T. L.(2003).Bayesian estimation of system reliability in Brownian stress-strength models.Ann. Inst. Statist. Math.,55,7-19.
  4. Carlin, B. P.,Louis, T. A.(2000).Bayes and Empirical Bayes Methods for Data Analysis.New York:
  5. Li, T. F.(2002).Bayes empirical bayes approach to estimation of the failure rate in exponential distribution.Comm. Statist.-Theory Methods,31,1457-1464.
  6. Lin, Y. P.,Liang, T.,Huang, W. T.(2002).Bayesian sampling plans for exponential distribution based on type I censoring data.Ann. Inst. Statist. Math.,54,100-113.
  7. Miller, R.,Nelson, W.(1983).Optimum simple step-stress plans for accelerated life testing.IEEE Trans. Reliability,32,59-65.
  8. Nelson, W. B.(1980).Accelerated life testing step-stress models and data analysis.IEEE Trans. Reliability,29,103-108.
  9. Rene, V. D.,Thomas, A. M.,Gordon, E. F.,Lee, R. P.(1996).A bayes approach to step-stress accelerated life testing.IEEE Trans. Reliability,45,491-495.
print cancel