Magnetoresistance and Hall Effect Study of Electron- and Hole-Doped Cuprate Superconductorst

M. B. Maple；J. Herrmann；M. C. de Andrade；C. C. Almasan；S. H. Han；D. A. Gajewski；L. M. Paulius；Wu Jiang；S. N. Mao；R. L. Greene；A. P. Paulikas；Chun Gu；B. W. Veal

Chinese Journal of Physics

34卷2S期（1996 / 04 / 01）

471 - 478

英文

Hall effect measurements on single crystals of the hole-doped systems Y1-xPrxBa2Cu3O7-δ (c≈0.05) and YBa2Cu3Oy, as a function of x and y, respectively, showed that the Hall conductivity δxy vs B data in the mixed state could be described by the expression δxy = C1/B + C2B, where the two terms are associated with motion of the magnetic vortices and the quasi-particles in the vortex cores, respectively, and the parameters C1 and C2 are functions of x, y, and T. Magnetoresistance measurements on epitaxial thin films of the electron-doped superconductor Nd1.85Ce0.15CuO4±δ with varying oxygen content in magnetic fields B∣∣ c revealed (a) critical scaling of the electrical resistivity data consistent with a vortex-glass transition for a film with an optimum Tc ≈ 22 K and (b) a characteristic anomaly that develops with increasing field for T ＜ 2 K for an over-oxygenated film with Tc ≈ 10 K.

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