Analysis of Dielectric Breakdown Patterns in Parallel-plate Capacitors

Chia-Rong Sheu；Ching-Yen Cheng；Po-Shieng Wang；Chun-Yen Lee；Ru-Pin Pan

Chinese Journal of Physics

38卷3期（2000 / 06 / 01）

461 - 470

英文

The parallel-plate capacitor cells are used as model systems for studying the dielectric breakdown (DB) patterns. Air, a liquid crystal and several kinds of oils are used as the dielectric material sandwiched between the plates. We study the types of patterns formed with different materials, voltages and cell thickness. The fractal dimensions and the conditions for getting each type of DB pattern are obtained for the first time. In addition, the fractal dimensions of patterns simulated by using the active walker model (AWM) are also analyzed and compared with the experimental DB patterns.