Angular Dependence of Backscattering Enhancement from Randomly Very Rough Surfaces

Chin-Yuan Hsieh

Chinese Journal of Physics

38卷3期（2000 / 06 / 01）

491 - 515

英文

For specialized surfaces involving roughness large compared with the incident wavelength, backscattering enhancement takes place. The model developed in this paper predicts the phenomenon of backscattering enhancement from randomly very rough surfaces with large surface parameters. In the paper, we show the conditions for the transition of scatter energy between the forward and backward scattering directions. Further, we studied the conditions for the backscattering enhancement and found that the backscattering enhancement is apparent when the rms surface slope is larger than 0.5. We also found that the surface standard deviation, surface correlation length and the operating frequency are the three major factors for the backscattering enhancement. A derivation of the basic surface scattering model is provided and a computer calculation is also provided to compare the experimental measurements. In a comparison of the model developed in this paper with the measured data over a wide range of frequency and angle, excellent agreement was obtained. The difference between the model prediction and data is less than one dB.