Atom-by-Atom Analysis of Non-Metallic Materials by the Scanning Atom Probe

O. Nishikwa；M. Taniguchi

Chinese Journal of Physics

43卷1S期（2005 / 02 / 01）

111 - 123

英文

Utilizing the unique capability of the scanning atom probe (SAP) various carbon specimens including CVD diamond and carbon nano-tubes (CNT) and polythiophene were mass analyzed by field evaporating surface atoms. The carbon specimens absorb a large amount of hydrogen. Hydrogen absorption and desorption characteristics of CNT may suggest that the hydrogen absorbability may be closely related with the fabrication process. The mass analysis of polythiophene indicates that sulfur atoms are strongly bound with carbon atoms and no single sulfur atom is detected. The mass spectrum of polythiophene indicates that the double bonds are stabler than the single bonds. Field emission characteristics of polythiophene suggests that the polythiophene is semiconductive and its work function is larger than that of silicon.