题名

A Journey in the Atomic-Scale Microstructure of Materials Using Atom-Probe Tomography

作者

D. Blavette;C. Pareige;E. Cadel;P. Auger;B. Deconihout

关键词
期刊名称

Chinese Journal of Physics

卷期/出版年月

43卷1S期(2005 / 02 / 01)

页次

132 - 144

内容语文

英文

英文摘要

The 3D atom probe (3DAP or atom probe tomography) is the only nanoanalytical microscope able to provide 3D atomic-scale images. The role of this instrument in the investigation of the microstructure of metallic alloys is illustrated through various examples. Thanks to the ultimate spatial resolution of 3DAP, a Cottrell atmosphere was imaged for the first time in 3D and at the atomic scale. Reconstructed images have dimensions close to that of Monte Carlo simulations (MCS), as a result real experiment and numerical experiment can be directly confronted so that to validate models and MCS parameters. This will be illustrated through the investigation of the kinetics of precipitation and ordering in a model NiCrAl superalloy. Both approaches indicate that phase separation starts through a classical nucleation and growth process rapidly followed by a corasening regime.

主题分类 基礎與應用科學 > 物理