题名 |
製造業生産測試項目減免高低溫時,常溫設定Guard Band規格的方法 |
并列篇名 |
Title: Production Testing Item Eliminating/Sampling Algorith (Guard-band Implementation) |
DOI |
10.29999/QM.200702.0015 |
作者 |
范光啓;湯盛全 |
关键词 | |
期刊名称 |
品質月刊 |
卷期/出版年月 |
43卷2期(2007 / 02 / 01) |
页次 |
51 - 55 |
内容语文 |
繁體中文 |
英文摘要 |
The process capability indices (PCIs) are widely used to evaluate a manufacturer's general process capability. PCIs are generally defined as the ratio of the allowable tolerance of a quality characteristic to the actual process performance. Besides, First Pass Yield (FPY) is also an index to evaluate qualify characteristic progress. However PCIs and FPY are not enough for defining so call ”Guard-band” of some testing items with high/low and room temperature. In order to well control quality cost and have good productivity, manufacturer should have a general rule to evaluate the test items between pre-production and mass production stage. This article is not only to provide a general rule for eliminating/sampling test items, but also a method to facilitating process improvement. |
主题分类 |
社會科學 >
管理學 |