液晶顯示器模組之加速壽命試驗實證研究與統計分析－以串性干擾現象為例

Empirical and Statistical Evaluation for the Accelerated Life Test of LCD module-crosstalk Phenomenon as an Example

陳永璋(Yung-Chung Chen)；李佩熹(Pei-His Lee)；黃靖雯(Ching-Wen Huang)；徐國華(Kuo-Hua Hsu)

液晶顯示器模組 ； 加速壽命試驗 ； 韋氏分配 ； 串信干擾 ； LCD Modules ； Accelerated Life Testing ； Weibull Distribution ； Crosstalk

品質學報

13卷1期（2006 / 03 / 01）

21 - 33

繁體中文

液晶顯示器產業是目前全球相當受到注意的產業，在國內經濟發展上扮演非常重要之角色。然而有關液晶顯示器相關之加速壽命試驗文獻甚少。為因應國內產業需要，本研究，就液晶顯示器模組以Physics-Statistics-based model來建構液晶顯示模組中驅動IC效能失效之ALT可靠度模型。模型中設定影響產品壽命之環境因素為溫度與溼度。結果顯示溼度對於因驅動IC上Bump退化所產生之串性干擾失效具較大的影響。

In recent years, Taiwan has become the global first three production country in liquid crystal display industry. This industry plays an important role in the development of domestic economy. This research was carried on the accelerated life test by the temperature and the humidity as the parameters. Failure analysis and statistical analysis show that crosstalk phenomenon was the common failure pattern in this study. We also utilized the statistical method establishment life failure model, and the estimate the reliable life for the products. Humidity was shown as the more important factor for the crosstalk phenomenon on LCD modules than temperature.

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