参考文献
|
-
Tseng, Y.-H.,Tsai, D.-M.(2006).Using independent component analysis based process monitoring in TFT-LCD manufacturing.Journal of the Chinese Institute of Industrial Engineers,23(3),262-267.
連結:
-
Apley, D. W.,Shi, J.(2001).A factor-analysis method for diagnosing variability in multivariate manufacturing processes.Technometrics,43(1),84-95.
-
Apley, D. W.,Shi, J.(1998).Diagnosis of multiple fixture faults in panel assembly.Journal of Manufacturing Science and Engineering,120,793-801.
-
Barton, R. R.,González-Barreto, D. R.(1999).Process-Oriented basis representations linking manufacturing process design and diagnosis.Proceedings of the 6th European Concurrent Engineering Conference
-
Basseville, M.,Nikiforov, I. V.(1993).Detection of Abrupt Changes: Theory and Application.Englewood Cliffs, NJ.:Prentice Hall.
-
Box, G. E. P.,Jenkins, G. M.,Reinsel, G. C.(1994).Time Series Analysis: Forecasting and Control.Englewood Cliffs, NJ.:Prentice Hall.
-
Ceglarek, D.,Shi, J.(1996).Fixture failure diagnosis for autobody assembly using pattern recognition.Journal of Engineering for Industry,118(1),55-66.
-
Da, H.,Ekere, N. N.,Currie, M. A.(1998).The behavior of solder pastes in stencil printing with vibrating squeegee.IEEE Transactions on Components, Packaging, and Manufacturing Technology Part C,21(4),317-324.
-
Feldmann, K.,Sturm, J.(1994).Closed loop quality control in printed circuit assembly.IEEE Transactions on Components, Packaging, and Manufacturing Technology Part A,17(2),270-276.
-
Glass, S.,Thomsen, J.(1993).How SMT boards are assembled?.Printed Circuit Fabrication,16,42-47.
-
Gonzalez-Barreto, D. R.(1996).Centre County, Pennsylvania,Pennsylvania State University.
-
Hyvärinen, A.,Oja, E.(2000).Independent component analysis: algorithms and applications.Neural Networks,13(4-5),411-430.
-
Jianbiao, P.,Tonkay, G. L.,Storer, R. H.,Sallade, R. M.,Leandri, D. J.(2004).Critical variables of solder paste stencil printing for micro-BGA and fine-pitch QFP.IEEE Transactions on Electronics Packaging Manufacturing,27(2),125-132.
-
Jiao, W.,Yang, S.,Qian, S.,Yan, G.(2006).A new method for recognition of independent noise sources of complex system under strong noisy environment.China Mechanical Engineering,17(7),673-677.
-
Johnson, R. A.,Wichern, D. W.(1998).Applied Multivariate Statistical Analysis.Upper Saddle River, NJ.:Prentice Hall.
-
Kano, M.,Tanaka, S.,Ohno, H.,Hasebe, S.,Hashimoto, I.(2002).The use of Independent component analysis for multivariate statistical process control.Proceedings of International Symposium on Advanced Control of Industrial Processes (AdCONIP' 02)
-
Kresta, J. V.,Macgregor, J. F.,Marlin, T. E.(1991).Multivariate statistical monitoring of process operating performance.The Canadian Journal of Chemical Engineering,69(1),35-47.
-
Lee, H. Y.,Apley, D. W.(2004).Diagnosing manufacturing variation using second-order and fourth-order statistics.The International Journal of Flexible Manufacturing Systems,16(1),45-64.
-
Montgomery, D. C.(2005).Introduction to Statistical Quality Control.New York:John Wiley & Sons.
-
Nomikos, P.,MacGregor, J. F.(1994).Monitoring batch processes using multiway principal component analysis.AIChE Journal,40(8),1361-1375.
-
Tobias, R. D.(1995).An introduction to partial least squares regression.Proceedings of the 20th SAS Users Group International Conference
|