建構半導體廠跨廠績效評估以提昇資源分配決策品質之研究

Research for Constructing the Inter-fab Performance Evaluation Model to Enhance the Resource Allocation Decision Quality

10.6220/joq.2013.20(4).04

周明璇(Ming-Hsuan Chou)；陳文智(Wen-Chih Chen)；簡禎富(Chen-Fu Chien)

跨廠績效評估 ； 資料包絡分析 ； 決策品質 ； 半導體製造 ； 全面資源管理 ； inter-fab performance evaluation ； data envelopment analysis ； decision quality ； semiconductor manufacturing ； total resource management

品質學報

20卷4期（2013 / 08 / 01）

427 - 444

繁體中文

半導體製造為資本密集且高度競爭的高科技產業，為了維持競爭優勢，如何提升生產力以更有效地運用各種投入資源成為各企業重要的課題。本研究以紫式決策分析架構和資料包絡分析法為基礎，建立半導體跨廠績效評估模式，使用多項製造指標以衡量各廠之相對效率，並以臺灣某半導體公司之晶圓廠為實證以檢驗效度，並結合領域專家的知識，給予各項指標改善的方向與建議，以提昇跨廠資源分配的決策品質。本研究以實例說明生產規模與生產績效之間的變化趨勢，分析各廠所面臨的優勢與弱勢指標，研究發現藉由企業內部廠際間的評比，可以幫助管理者瞭解各個決策單位執行狀況，並作適當地資源配置，設定改善的方向與幅度，實證研究已驗證本研究之效度與可行性。

Semiconductor manufacturing is very capital intensive and competitive. It is important to optimize the utilization of various resources to generate the outputs efficiently for maintaining competitive advantages. This research aims to conduct data envelopment analysis based on UNISON framework for inter-fab performance evaluation with multiple indices from the constructed objective hierarchy. An empirical study was conducted with real data collected from a leading Taiwan semiconductor company to estimate the validity of the proposed approach. The results can support the decision maker to determine the improvement directions for appropriate resource allocations and thus demonstrate the practical viability of the proposed approach.

1. Chien, C.-F.,Chen, C.-P.,Chen, C.-H.(2009).Designing performance indices and a novel mechanism for evaluating government R & D projects.Journal of Quality,16(2),119-135.
   連結：
2. Wu, J.-Z.,Hsu, C.-Y.(2009).Critical success factors for improving decision quality on collaborative design in the IC supply chain.Journal of Quality,16(2),95-108.
   連結：
3. 簡禎富、胡志翰(2011)。全面資源管理架構：以晶圓廠為實證。品質學報，18(6)，581-607。
   連結：
4. 簡禎富、游智閔、徐紹鐘(2009)。紫式決策分析以建構半導體晶圓廠人力規劃決策模型。管理與系統，16(2)，157-180。
   連結：
5. Banker, R. D.,Charnes, A.,Cooper, W. W.(1984).Some models for estimating technical and scale inefficiencies in data envelopment analysis.Management Science,30(9),1078-1092.
6. Carbone, T. A.(2000).Measuring efficiency of semiconductor manufacturing operations using data envelopment analysis (DEA).Proceedings of the 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference
7. Caves, D. W.,Christensen, L. R.,Diewert, E. W.(1982).The economic theory of index numbers and the measurement of input, output, and productivity.Econometrica,50(6),1393-1414.
8. Charnes, A.,Cooper, W. W.,Rhodes, E.(1978).Measuring the efficiency of decision making units.European Journal of Operational Research,2(6),429-444.
9. Chen, W.-C.,Chien, C.-F.(2011).Measuring relative performance of wafer fabrication operations: a case study.Journal of Intelligent Manufacturing,22(3),447-457.
10. Chien, C.-F.,Chen, W.-C.,Hsu, S.-C.(2010).Requirement estimation for indirect workforce allocation in semiconductor manufacturing.International Journal of Production Research,48(23),6959-6976.
11. Chien, C.-F.,Chen, W.-C.,Lo, F.-Y.,Lin, Y.-C.(2007).A case study to evaluate the productivity changes of the thermal power plants of the Taiwan power company.IEEE Transactions on Energy Conversion,22(3),680-688.
12. Chien, C.-F.,Hsu, C.-Y.(2011).UNISON analysis to model and reduce step-and-scan overlay errors for semiconductor manufacturing.Journal of Intelligent Manufacturing,22(3),399-412.
13. Chien, C.-F.,Wang, H.-J.,Wang, M.(2007).A UNISON framework for analyzing alternative strategies of IC final testing for enhancing overall operational effectiveness.International Journal of Production Economics,107(1),20-30.
14. Chu, M.-T.,Shyu, J. Z.,Khosla, R.(2008).Measuring the relative performance for leading fabless firms by using data envelopment analysis.Journal of Intelligent Manufacturing,19(3),257-272.
15. Cooper, W. W.,Seiford, L. M.,Zhu, J.(2011).Handbook on Data Envelopment Analysis.New York:Springer.
16. Färe, R.,Grosskopf, S.,Lindgren, B.,Roos, P.(1992).Productivity changes in Swedish pharmacies 1980-1989: a non-parametric malmquist approach.Journal of Productivity Analysis,3(1-2),85-101.
17. Färe, R.,Grosskopf, S.,Valdmanis, V.(1989).Capacity, competition, and efficiency in hospitals: a nonparametric approach.Journal of Productivity Analysis,1(2),123-138.
18. Farrell, M. J.(1957).The measurement of productive efficiency.Journal of the Royal Statistical Society,120(3),253-290.
19. Golony, B.,Roll, Y.(1989).An application procedure for DEA.OMEGA,17(3),237-250.
20. Kozmetsky, G.,Yue, P.(1998).Comparative performance of global semiconductor companies.OMEGA,26(2),153-175.
21. Leachman, R. C.,Ding, S.,Chien, C.(2007).Economic efficiency analysis of wafer fabrication.IEEE Transactions on Automation Science and Engineering,4(4),501-512.
22. Leachman, R. C.,Hodges, D.(1996).Benchmarking semiconductor manufacturing.IEEE Transactions on Semiconductor Manufacturing,9(2),158-169.
23. Liu, F.-H. F.,Wang, P.-H.(2008).DEA Malmquist productivity measure: Taiwanese semiconductor companies.International Journal of Production Economics,112(1),367-379.
24. Seiford, L. M.,Zhu, J.(1999).Profitability and marketability of the top 55 U.S. commercial banks.Management Science,45(9),1270-1288.
25. Wu, J.-Z.,Chien, C.-F.(2008).Modeling strategic semiconductor assembly outsourcing decisions based on empirical settings.OR Spectrum,30(3),401-430.
26. 高強、黃旭男、Sueyoshi, T.(2003)。管理績效評估：資料包絡分析法。臺北:華泰文化。
27. 簡禎富(2005)。決策分析與管理。臺北:雙葉書廊。

1. 簡禎富、胡益芬、侯建良、林國義、吳建瑋、朱珮君(2017)。推動高等教育校務經營全面品質管理之研究─以國立清華大學為實證。管理與系統，24(4)，591-614。
2. 簡禎富、林國義(2016)。建構半導體晶圓廠整廠績效指標架構與全面資源管理。管理與系統，23(4)，451-474。