题名

Binary Column Assignment Method for Two-Level Minimum Aberration Fractional Factorial Designs

并列篇名

兩水準最小像差部分設計的二進制行配置法

DOI

10.6220/joq.202304_30(2).0001

作者

Jen-der Day(戴貞德)；Hsin-Lu Liu(劉信陸)；Tsai-Hsin Cheng(鄭再興)；Yu-Lin Han(韓育霖)；Hsien-Tang Tsai(蔡憲唐)

关键词

geometrical design ； minimum aberration ； resolution ； right-half R-III design ； wordlength pattern ； 幾何設計 ； 最小像差 ； 解析度 ； 右半解析度III設計 ； 字長樣式

期刊名称

品質學報

卷期/出版年月

30卷2期（2023 / 04 / 30）

页次

67 - 88

内容语文

英文;繁體中文
中文摘要

Weighing the pros and cons between the resolution and experimental runs, we believe that resolution III designs still have practical value and are worthy of attention. This paper uses the binary representation of the number of factors and proposes a binary column assignment method for constructing minimum aberration (MA) geometrical designs. Then we develop a combinatorial algorithm and the closed-form formulae for the wordlength pattern (WLP) of a right-half resolution III (R-III) design, which can be used to calculate the WLPs for (1) all R-III MA designs from 8 to 256 runs; (2) a family of R-III MA designs constructed by using MA 128-run designs; and (3) the large R-III weak MA designs.
英文摘要

權衡解析度和實驗次數之間的利弊，可以得知解析度III的設計仍然有其實用價值且值得關注。本文運用因子數的二進制表示法，提出了二進制行配置法來建構具有最小像差的兩水準部分幾何設計。之後，我們為右半解析度III部分設計的字長樣式開發了組合演算法和封閉公式，其可用於計算下列三種特殊設計的字長樣式：（1）具有8到256實驗次數的所有解析度III且最小像差的部分設計；（2）運用128實驗次數最小像差設計所建構的解析度III且最小像差的部分設計之系列；（3）大型解析度III且弱最小像差的部分設計。
主题分类 社會科學 > 管理學
参考文献
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