题名 |
Generalized Ray Tracing and Its Applications |
DOI |
10.30011/OE.200306.0003 |
作者 |
G. Groot Gregory |
关键词 | |
期刊名称 |
光學工程 |
卷期/出版年月 |
82期(2003 / 06 / 01) |
页次 |
14 - 27 |
内容语文 |
英文 |
英文摘要 |
Raytracing is used in many applications to simulate physical phenomena. In optical applications, the concepts of sequential and non-sequential raytrace are commonly used is optical design and analysis software. A broader Generalized Raytrace technique will be described as well as how it is used to solve imaging and non-imaging optical analysis tasks. This technique performs the typical reflection and refraction calculation that occur due to surface interactions and includes physical models to simulate surface and bulk scattering, polarization and birefringence and permits analysis on arbitrarily complex geometric systems. |
主题分类 |
基礎與應用科學 >
物理 工程學 > 工程學總論 |