半導體晶圓測試探針卡取得決策之研究-以某公司驅動IC產品實證為例

蔡英傑

山西大学，您好！

感谢采购，人社期刊库｜人社论文库，期间：2025/01/01~2025/12/31

感谢试用，科学期刊库｜科学论文库，期间：2024/10/20~2025/01/20

浏览高级检索

关闭
检索检索高级检索出版物检索
浏览期刊主题浏览核心期刊浏览期刊拼音浏览

关闭

查询符号(半角)	查询符号意义说明
空格	表示为「AND」两个查询词之交集
双引号 ( " " )	片语以双引号标示开始及结束，而且只寻找出现顺序相同的字词，例： " image process "
?	表示一个字母切截，输入两个?表两个字母，依此类推，例：输入「Appl?」，查得结果应为appl e , appl y … ( 常用于英文字查询 )
*	表示不限字母切截，由0~n. 例：输入「appl*」，查得结果应为appl e , appl es , appl y , appl ied , appl ication … ( 常用于英文字查询 )
AND、OR、NOT	布尔逻辑组合关键字，用来扩大或缩小查询范围的技巧。 (1) AND ：缩小查询范围 (2) OR ：扩大查询范围(3) NOT：排除不相关的范围

DOI 是数位物件识别码（ D igital O bject I dentifier ）的简称，
为物件在网路上的唯一识别码，可用于永久连结并引用目标物件。

使用DOI作为永久连结

每个DOI号前面加上「 http://dx.doi.org/ 」便成为永久网址。
如以DOI号为 10.5297/ser.1201.002 的文献为例，此文献的永久连结便是： http://dx.doi.org/ 10.5297/ser.1201.002 。
日后不论出版单位如何更动此文献位置，永久连结所指向的位置皆会即时更新，不再错失重要的研究。

引用含有DOI的文献

有DOI的文献在引用时皆应同时引用DOI。若使用APA、Chicago以外未规范DOI的引用格式，可引用DOI永久连结。

DOI可强化引用精确性、增强学术圈连结，并给予使用者跨平台的良好使用经验，目前在全世界已有超过五千万个对象申请DOI。如想对DOI的使用与概念有进一步了解，请参考（）。

书目管理工具

相关连结

问题回报

全文下载

半导体晶圆测试探针卡取得决策之研究-以某公司驱动IC产品实证为例

Semiconductor Wafer Testing Probe Card Acquirement Decision Strategy in LCD IC Product

蔡英杰 , 硕士　　导师：简祯富　　

繁体中文

紫式决策分析；决策树；探针卡；取得决策；多属性决策分析；晶圆测试；风险轮廓图； UNISON decision analysis ； Decision tree ； Probe card ； Acquirement Decision Strategy ； Multiple attribute decision analysis ； Wafer test ； Risk profile

0 个人觉得这篇文章赞

摘要 │ 参考文献 (44) │ 国际计量

摘要〈TOP〉

并列摘要〈TOP〉

Abstract
Technology developments come from the real life requirements. Various types of electronic goods, such as mobile phones, televisions, tablet PCs, are indispensable in the public life recently. As an important part of electronic products, the display develops toward multi-color, high-speed, rapid response and low energy consumption trend. Product life cycle in display industry becomes shorter and shorter while sales price getting lower and lower. Facing costs decreasing year by year in trendency, how to improve the efficiency of the foundry and control gross margin to cope with industrial development trends has been a new critical issue for back-end IC test foundries.
In this paper, to solve the main consumables acqusition problem of the probe card for wafer testing, a probe card acqusition decision-making framework is constructed based on the UNISON decision-making framework by using the influence graph and the decision tree method. Besides, risk profile and sensitivity analysis are used to obtain the mode of choice for probe card supplies to make decision in practical problem.
To test the validity of the research structure, this study takes a Taiwan semiconductor wafer test company as a case. All the discarded probe cards are obtained from the foundry source and the specific customer model. Based on the decision hierarchy analysis method, the proposed model is established to analyze probe card acquisition decision problem and serves as a reference for decision makers. Meanwhile, refer to success rate of the sensitivity of graph analysis, decision maker can aquire the implementation of future decision with average efficiency of the probe card production decision-making estimates. The empirical results show that this study is effective and feasible. Its analytical practices and methods can also be a basis of reference flow and architecture.provide for other decision-making issues related to material acquisition.

参考文献 ( 44 ) 〈TOP〉

Borison, Adam, “Real Options Analysis: Where Are the Emperor's Clothes?” Journal of Applied Corporate Finance, vol. 17, no. 2, pp. 17-31, March 2005.
连结：
Chen-Fu Chien,Yu-Shian Chiang,Chih-Chiang Chen,Real Option Analysis for Capacity Investment Planning for Semiconductor Manufacturing(2007).
连结：
Chen-Fu Chien and Ying-Jen Chen, Manufacturing Intelligence and Smart Production for Industry 3.5 and Empirical Study of Decision-based Virtual Metrology for Controlling Overlay Errors (2016 )
连结：
Chen-Fu Chien,Jei-Zheng Wu Analyzing Repair Decisions in the Site Imbalance Problem of Semiconductor Test Machines (2003).
连结：
Chen-Fu Chien, Chih-Wei Hsiao1, Cheng Meng, Kuo-Tong Hong, Szu-Tsung Wang Cycle Time Prediction and Control Based on Production Line Status and Manufacturing Data Mining (2005).
连结：

国际计量

〈TOP〉

E-mail ：

文章公开取用时，将寄通知信至您填写的信箱地址

E-mail ：

使用DOI作为永久连结

引用含有DOI的文献

DOI可强化引用精确性、增强学术圈连结，并给予使用者跨平台的良好使用经验，目前在全世界已有超过五千万个对象申请DOI。 如想对DOI的使用与概念有进一步了解，请参考 （ ） 。

DOI可强化引用精确性、增强学术圈连结，并给予使用者跨平台的良好使用经验，目前在全世界已有超过五千万个对象申请DOI。如想对DOI的使用与概念有进一步了解，请参考（）。