英文摘要
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We have studied the dielectric properties of the sdsCu04 samples that were annealed under different conditions by means of capacitance C(T,w) and dissipation factor D(T,w) measurements with the test frequency w in the range 20 Hz to 1 MHz and at temperature T between 5 K and 325 K. We observed two frequency-dependent peaks in the D(T,w) curves and corresponding features in the C(T,w) curevs. The first peak occurs at T ≈ 230 K is due to the occurrence of the antiferromagnetic transition in the sample and rhe second one occurs at T z 120 K is related to the change of the conduction mechanism in this system.
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