题名 |
High Al Content in Al(subscript x)Ga(subscript 1-x)N on GaN Buffer/Sapphire Grown by RFMBE |
DOI |
10.29808/JVSROC.200512.0020 |
作者 |
黃健峻(J. J. Huang);錢韋至(W. C. Chien);林舜寬(S. K. Lin);盧勝利(S. L. Lu);蔡孟希(M. C. Tsai);吳祖儀(Z. Y. Wu);施博文(P. W. Sze);洪茂峰(M. P. Houng);王永和(Y. H. Wang) |
关键词 | |
期刊名称 |
真空科技 |
卷期/出版年月 |
18卷3期(2005 / 12 / 05) |
页次 |
86 - 90 |
内容语文 |
英文 |
英文摘要 |
In this work, we have successfully grown high quality Al(subscript x)Ga(subscript 1-x)N (400 nm) films with high Al contents (x=0.5) on sapphire (0001) substrates with GaN (150 nm) buffer layers by radio frequency molecular beam epitaxy (RF-MBE). The relationship between the film quality and different Al contents will be discussed in depth. The X-ray diffraction (XRD) 2θ peak of the AlGaN/GaN structure is 34.66 and 35.43 degree with 0.5 aluminum compositions. A degradation of the crystalline quality of AlGaN layers is observed with increasing Al contents. The 6.42 arcmin full-width at the half-maximum (FWHM) of XRD is better than those reported. The 2.985 nm surface roughness for 2μm×2μm area is measured by the atomic force microscopy (AFM). |
主题分类 |
基礎與應用科學 >
基礎與應用科學綜合 基礎與應用科學 > 物理 工程學 > 工程學綜合 |
被引用次数 |
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